RESEARCH. CONNECTED.

Explore the scholarly record.

Discover prefix ownership, publishers, journals and DOI metadata. Understand the data behind every publication.

DOI RECORD

Mitigating the Resolution-Field of View Trade-Off for Comprehensive Microstructural Characterization with Advanced AI Methods

Aawaz Raj Pokhrel iD, Jayanti Das iD, Boren Ke iD, Lisa Ma iD, Shawn Zhang iD, Maxwell Korang-Yeboah iD

DOI10.1208/s12249-026-03558-5

PublisherSpringer Science and Business Media LLC

Journal / SourceAAPS PharmSciTech

Published2026-09-29

Metadata Deposited2026-09-29 (updated: 2026-09-29)

Subject—

Languageen

ISSN1530-9932

Typejournal-article

Volume / Issue / Pages27 / 7 / —

Citations0

References deposited64

Access / license metadataAccess not determined License 1 ↗A reuse license does not by itself establish whether the full text is freely readable.