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DOI RECORD

Cu/Bi layer stacking engineering the characteristics of Cu3BiS3 thin films

M. Pavan Sai Reddy, Y.B.Kishore Kumar iD

DOI10.1016/j.physb.2026.419495

PublisherElsevier BV

Journal / SourcePhysica B: Condensed Matter

Published2026-10

Metadata Deposited2026-10-08 (updated: 2026-10-08)

Subject—

Languageen

ISSN0921-4526

Typejournal-article

Volume / Issue / Pages— / — / 419495

Citations0

References deposited45

Access / license metadataRestricted reuse / TDM license License 1 ↗ License 2 ↗ License 3 ↗ License 4 ↗ License 5 ↗ License 6 ↗ License 7 ↗A reuse license does not by itself establish whether the full text is freely readable.